Microscope Lamps and Accessories
Electron Microscopy Sciences Mertz Graticle NGM1, 21mm
Used to estimate the three-dimensional surface areas or the surface density of a component in a given volume, when the component does not have a random orientation. It comprises a test system with parallel curved lines used for measuring the intersection of points. Reference: W.A. Mertz. "Mikroskopic" Vol. 22 1967 pp 132-142.
Size: 21 mm
Electron Microscopy Sciences Pinhole Aperture, 10 µm
These pinholes are prepared from pure copper foil, 3 mm in diameter, 25 microns thick. They possess very high roundness and edge retention. Blackened on one surface. Mounted in black anodized aluminum discs. Mounted in a recessed hole in an anodized holder, 16 mm in diameter.
Electron Microscopy Sciences Maxtaform London Finder Grid, 135 mesh Nickel, 188 µm Pitch
Maxtaform grids with reference patterns are of the highest consistent quality.
Material: Nickel
Pitch: 188 µm
Electron Microscopy Sciences Maxtaform 400 mesh, Gold
Maxtaform grids with clean and smooth edges, firm support, and a large open area. 3 mm diameter, 0.75 mil thickness.
Grid: Gold
Pitch: 63 µm
Hole: 43 µm
Bar: 20 µm
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Electron Microscopy Sciences Cylinder Mount SEM 3/8" head, 3/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 3/8"
Pin height: 3/16"
Electron Microscopy Sciences Weibel 2 Graticle NGW2, 19mm
Used when making a surface to volume ratio of a structure per mass unit. This graticule consists of a number of short lines with interruptions as long as the lines. Basically, the number of intersections falling over the short lines is counted and the number of endpoints falling on the end of the structure is determined. Reference: E.R. Weibel, Journal of Microscopy Vol. 95. pp 373-378. Current Capabilities and Limitations of Available Sterrological Technique, point counting method.
Size: 19 mm
Electron Microscopy Sciences Carbon Rods, ¼" diameter, 12" OAL
Technical grade has a typical impurity level of 50ppm or greater and may be used in applications of non critical SEM coating applications.
Diameter: 1/4"
OAL: 12"
Electron Microscopy Sciences Concentric Circles Graticle NE22, 21mm, 0.5 mm - 12 mm diameter
This design leaves the circle clear of obstruction. In addition the intermediate lines are broken to improve ease of reading.
Size: 21mm
Electron Microscopy Sciences Concentric Circles Graticle NE22, 16mm, 0.5 mm - 12 mm diameter
This design leaves the circle clear of obstruction. In addition the intermediate lines are broken to improve ease of reading.
Size: 16mm
Electron Microscopy Sciences Chessboard Squares Graticle NE15, 19mm
The dark squares are translucent. Used as an alternative to simple grids for area of specimen determination and paricle counting. Alternative light and dark squares help to reduce eyestrain.
Size: 19mm
Divisions: 2.0 mm squares
Ted Pella Inc PELCO Center-Marked Grids, 200 mesh, 3.0mm O.D., Copper, 100/vial
The PELCO Grids are usually somewhat thicker than similar TEM grids made by electro plating processes which makes them stiffer and easier to handle without the danger of bending, but still maintain a good definition of the grid bars. The wide rims (350-400µm) on the PELCO Grids provide additional stiffness and minimize the potential of interfering with the sample when picking up and handling the grids with tweezers
